Introduction to Spectroscopic Ellipsometry of Thin Film Materials Ebook Tooltip Ebooks kunnen worden gelezen op uw computer en op daarvoor geschikte e-readers. Instrumentation, Data Analysis, and Applications
Afbeeldingen
Sla de afbeeldingen overArtikel vergelijken
- Engels
- E-book
- 9783527833955
- 08 maart 2022
- Adobe ePub
Samenvatting
A one-of-a-kind text offering an introduction to the use of spectroscopic ellipsometry for novel material characterization
In Introduction to Spectroscopic Ellipsometry of Thin Film Materials: Instrumentation, Data Analysis and Applications, a team of eminent researchers delivers an incisive exploration of how the traditional experimental technique of spectroscopic ellipsometry is used to characterize the intrinsic properties of novel materials. The book focuses on the scientifically and technologically important two-dimensional transition metal dichalcogenides (2D-TMDs), magnetic oxides like manganite materials, and unconventional superconductors, including copper oxide systems.
The distinguished authors discuss the characterization of properties, like electronic structures, interfacial properties, and the consequent quasiparticle dynamics in novel quantum materials. Along with illustrative and specific case studies on how spectroscopic ellipsometry is used to study the optical and quasiparticle properties of novel systems, the book includes:
- Thorough introductions to the basic principles of spectroscopic ellipsometry and strongly correlated systems, including copper oxides and manganites
- Comprehensive explorations of two-dimensional transition metal dichalcogenides
- Practical discussions of single layer graphene systems and nickelate systems
- In-depth examinations of potential future developments and applications of spectroscopic ellipsometry
Perfect for master’s- and PhD-level students in physics and chemistry, Introduction to Spectroscopic Ellipsometry of Thin Film Materials will also earn a place in the libraries of those studying materials science seeking a one-stop reference for the applications of spectroscopic ellipsometry to novel developed materials.
Productspecificaties
Inhoud
- Taal
- en
- Bindwijze
- E-book
- Oorspronkelijke releasedatum
- 08 maart 2022
- Ebook Formaat
- Adobe ePub
- Illustraties
- Met illustraties
Betrokkenen
- Hoofdauteur
- Andrew T. S. Wee
- Tweede Auteur
- Xinmao Yin
- Hoofduitgeverij
- Wiley-Vch
Lees mogelijkheden
- Lees dit ebook op
- Desktop (Mac en Windows) | Kobo e-reader | Android (smartphone en tablet) | iOS (smartphone en tablet) | Windows (smartphone en tablet)
Overige kenmerken
- Editie
- 1
- Studieboek
- Nee
EAN
- EAN
- 9783527833955
Je vindt dit artikel in
Kies gewenste uitvoering
Prijsinformatie en bestellen
De prijs van dit product is 90 euro en 99 cent.- E-book is direct beschikbaar na aankoop
- E-books lezen is voordelig
- Dag en nacht klantenservice
- Veilig betalen
Rapporteer dit artikel
Je wilt melding doen van illegale inhoud over dit artikel:
- Ik wil melding doen als klant
- Ik wil melding doen als autoriteit of trusted flagger
- Ik wil melding doen als partner
- Ik wil melding doen als merkhouder
Geen klant, autoriteit, trusted flagger, merkhouder of partner? Gebruik dan onderstaande link om melding te doen.